von LAUS (BD)
Characterization of Nanoparticles
Did you know that there are two direct techniques of characterizing nanoparticles <100 nm?
You need a multitude of analytical tools to describe a nanomaterial sufficiently:
FTIR with ATR / XRF or ICP-MS / XRD incl. Rietveld analysis / BET / Zeta Potential / DLS / PSD / EDX…
But transmission electron microscopy (TEM) and scanning electron microscopy (SEM) are the only direct methods to analyze particles below 100 nm in diameter (in at least one dimension) and to describe primary particles in size and form as well as their agglomeration state appropriately.
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